• 专利附录
  • 专利说明
  • 权利要求
  • 类似技术
  • 同族专利
  • 引用文献
  • 法律状态
  • 优先权
    • 专利摘要:
    A method and a device for measuring an effective atomic number of an object. The device comprises: a ray source, used for generating a first X-ray beam of first energy and a second X-ray beam of second energy; a Cherenkov detector (2), used for receiving the first X-ray beam and the second X-ray beam that pass through an object under test, and generating a first detection value and a second detection value; and a data processing device, used for obtaining an effective atomic number of the object under test based on the first detection value and the second detection value, a surface, of an optical-to-electric conversion device (21) of the Cherenkov detector (2), receiving Cherenkov light, is approximately parallel to the incident direction of the X-ray beam. As a Cherenkov detector is capable of eliminating the influences of an X-ray beam under a specific threshold, the accuracy for substance identification is enhanced; meanwhile, due to the special installation position of the optical-to-electric conversion device, the nuclear counter effect can be reduced or eliminated.
    公开号:AU2012361427A1
    申请号:U2012361427
    申请日:2012-12-28
    公开日:2014-08-14
    发明作者:Zhiqiang Chen；Shuwei Li；Yuanjing Li；Yinong Liu；Yi Wang；Qingjun Zhang；Wenjian Zhang；Shuqing Zhao；Ziran Zhao；Weibin Zhu
    申请人:Tsinghua University；Nuctech Co Ltd；
    IPC主号:G01T1-22
    专利说明:
    FP140115-English translation of the specification METHODS AND APPARATUSES FOR MEASURING EFFECTIVE ATOMIC NUMBER OF AN OBJECT TECHNICAL FIELD The present application relates to security inspection, and particularly to 5 methods and apparatuses for measuring an effective atomic number (Zeft) of an object. BACKGROUND An X-ray inspection system includes an X-ray source and a corresponding detector, with the inspected object being between the source and the detector. 10 Collimated X-ray beams pass through the object and arrive at the detector. The magnitude of signals outputted from the detector represents the intensity of the X-ray beams arriving at the detector. The signals are converted to digital image about the inspected object. The X-rays interact with an object primarily through three effects including 15 photoelectric effect, Compton effect, and electron pair effect. The cross-section of the photoelectric effect is proportional to about the fourth or fifth power of the atomic number of an object. The cross-section of the Compton effect is generally proportional to about the effective atomic number Zeft of the object. The generally interaction cross-section of the electron pair effect is proportional to about a square 20 of the Zeft of the object. When the energy of the X-rays is lower than 0.5MeV, the photoelectric effect dominates or has a larger interacton cross-section. At this time, the mass attenuation coefficient of each object is highly correlated with its Zeft. As the energy of the X-rays increases to around 1MeV, the Compton effect becomes 25 dominant. At this time, the correlation between the mass attenuation coefficient of each object and its Zeft becomes weak. When the energy of the X-rays is higher than about 1.02MeV, the electron pair effect occurs. The interaction cross-section of the electron pair effect increases as the energy of the X-rays becomes higher. 1 FP140115-English translation of the specification Accordingly, the correlation between the mass attenuation coefficient of each object and its Zeft grows stronger. Then it is possible to obtain information of an object's Zeit by using two sets of X-ray beams of different energy levels to detect the object, and analyzing signals 5 from the two sets of X-ray beams. The X-ray beams having an energy level at the order of MeV are required for detecting an object of a large mass thickness. In the object identification using high-energy dual-energy X-ray beams, the detected object's mass attenuation coefficient and its Zeft are less correlated with respect to X-ray beams of lower energy (e.g., about 1MeV), while the correlation becomes 10 stronger with respect to X-ray beams of high energy (e.g., about 6MeV). Information of the detected object's Zet can be obtained by analyzing signals generated in the detector from the two types of X-ray beams having different energy levels. It can be regarded that the method is based on the different interaction cross-section ration between the Compton effect and pair effect for 15 those materials with different Zet. Currently, an electron accelerator is often used as X-ray source in X-ray inspection at the MeV energy level. In the electron accelerator, beams of electrons accelerated to the MeV energy level bombard a heavy metal target, and incurs bremsstrahlung that generates X-ray. The typical energy distribution of 20 such X-ray beams ranges from 0 to the energy of electron beam, popularly with the peak at around 0.4MeV. Its average energy generally in the range of 1.2 to 2MeV increases with the electron beam energy of the accelerator. In the Zeft discrimination practice of employing double X-ray beams from different energy accelerator, the lower-energy component (i.e, below 0.5MeV) of those X-ray beams 25 may worsen the object identification due to the photoelectric effect. A flat called by filtering sheet is often employed to reduce the number of photons of the lower-energy X-rays to improve the final Zeft discrimination, however, the result is seriously limited for it also give some reduction on higher-energy photon's number at the same time. 30 SUMMARY 2 FP140115-English translation of the specification Methods and apparatuses for measuring an effective atomic number Zeft of an object are provided in view of one or more problems with the conventional technologies. According to an embodiment, an apparatus for measuring an effective atomic 5 number of an object is provided. The apparatus includes: a ray source configured to product a first X-ray beam having a first energy and a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data 10 processing device configured to obtain an effective atomic number of the object based on the first detection value and the second detection value. According to a further embodiment, a method for measuring an effective atomic number of an object is provided. The method includes: producing a first X-ray beam having a first energy and a second X-ray beam having a second 15 energy; receiving, by a Cherenkov detector, the first X-ray beam and the second X-ray beam that pass through an object under detection, and generating a first detection value and a second detection value; and obtaining an effective atomic number of the object based on the first detection value and the second detection value. 20 In the above solutions, the Cherenkov detector can eliminate disturbance of X-rays below certain energy threshold with respect to the object identification. In this way, accuracy can be improved for object identification. BRIEF DESCRIPTION OF THE DRAWINGS Embodiments of the present invention will be detailed in connection with 25 figures. The above and other objects, features and advantages of the present invention will be more apparent. Throughout the figures, like reference numbers refer to like structure elements. In the figures: Fig. 1 is a schematic block diagram showing an apparatus for measuring an effective atomic number Zeft of an object using a Cherenkov detector according to 3 FP140115-English translation of the specification an embodiment of the present invention, and is a sectional view along line A-A of Fig. 2; Fig. 2 is a sectional view along line B-B of Fig. 1; Fig. 3 is a schematic diagram of a Cherenkov detector according to an 5 embodiment of the present invention; Fig. 4 is a schematic diagram of a Cherenkov detector according to another embodiment of the present invention; Fig. 5 is a schematic diagram of a Cherenkov detector according to a further embodiment of the present invention; 10 Fig. 6 is a schematic diagram showing another application of the Cherenkov detector shown in Fig. 5; and Fig. 7 is a schematic diagram of a Cherenkov detector according to a still further embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS 15 In the following, embodiments of the present invention will be detailed. To be noted, the described embodiments are just intended for illustrating other than limiting the present invention. Numerous specific details are illustrated for a clear and thorough understanding of the present invention. It is apparent to those skilled in the art that these specific details are not necessary for implementation of 20 the present invention. Detailed description of known circuits, materials or methods are omitted which otherwise may obscure the present invention. Throughout the specification, reference to "an embodiment," "embodiments," "an example" or "examples" means that particular features, structures or characteristics described in connection with such embodiment or example are 25 contained in at least one embodiment of the present invention. The phrase "an embodiment," "embodiments," "an example" or "examples" in various places throughout the specification does not necessarily refer to the same embodiment or example. Further, the particular features, structures or characteristics may be contained in one or more embodiments or examples in any appropriate 30 combination and/or sub-combination. Those skilled in the art will appreciate that 4 FP140115-English translation of the specification the figures are provided here for the purpose of illustration, and may not be drawn to scale. According to an embodiment of the present invention, a Cherenkov detector is used to detect dual-energy X-rays, in order to measure an effective atomic number 5 of an object under detection and thus identify the object. The Cherenkov detector is a threshold-type detector. When a charged ion travels in a transparent medium at a speed faster than the speed of light in the medium, Cherenkov radiation will occur, thereby generating Cherenkov light. The Cherenkov light may be converted into electric signals with a photodetector. In this way, detection values 10 may be obtained representing the intensity of X-rays that pass through the object under detection. Generally, X-rays of higher energy will generate secondary electrons with higher energy in the Compton Effect. When the secondary electrons travel at a speed higher than a required threshold, Cherenkov radiation occurs. Therefore, 15 there is a threshold requirement on incident X-rays. Materials (e.g., quartz) selected as a radiator may have a suitable refractivity, density and transparency, such that almost no Cherenkov radiation can occur in the radiator with respect to X-ray photons of lower energy (e.g., 0.5MeV). Then identification of an object's effective atomic number can be enabled by using a combination of the Cherenkov 20 detector and the dual-energy X-ray source, without adjustment on the energy composition of the X-ray source. Fig. 1 is a schematic block diagram showing an apparatus for measuring an effective atomic number of an object using a Cherenkov detector according to an embodiment of the present invention, and is a sectional view along line A-A of Fig. 25 2. As shown in Figs. 1 and 2, the apparatus for measuring an effective atomic number of an object using a Cherenkov detector and high-energy dual-energy X-rays may include a dual-energy electron accelerator 1, a Cherenkov detector 2, and an auxiliary circuit connected to the Cherenkov detector 2, such as a data 30 conversion circuit and a data processing device (not shown). The inspected 5 FP140115-English translation of the specification object placed between the Cherenkov detector 2 and the dual-energy electron accelerator 1. The dual-energy electron accelerator 1 may produce high- and low-energy X-ray beams in an alternate manner. The X-ray beams pass through a collimator 3 and then irradiate an object 4 under detection. The Cherenkov 5 detector 2 may receive X-ray beams that pass through the object 4. With the high-energy X-ray beams incident into the Cherenkov detector 2, a first electric signal is generated, for example, representing a first detection value. With the low-energy X-ray beams incident into the Cherenkov detector 2, a second electric signal is generated, for example, representing a second detection value. The data 10 processing device may calculate the object's effective atomic number based on the first and second detection values. According to an embodiment of the present invention, the electron accelerator 1 may produce the low- and high-energy X-ray beams by generating electron beams of different energy levels and bombarding a target with the electron beams. 15 Fig. 3 is a schematic diagram of a Cherenkov detector according to an embodiment of the present invention. The Cherenkov detector 2 shown in Fig. 3 includes a radiator 22 and a photoelectric detection element 21. The surface of the radiator 22 is covered with a sheet of reflector 23 and a light-proof layer 24. The photoelectric detection element 21 is arranged at an end of the radiator 22. 20 X-ray beams enter at the other end of the radiator 22, and generate Cherenkov light while passing through the radiator 22. The surface of the photoelectric detection element 21 that receives the Cherenkov light is perpendicular to the incident X-ray beams. The photoelectric detection element 21 converts the received Cherenkov light into electric signals. 25 In the Cherenkov detector as shown in Fig. 3, the photoelectric detection element is susceptible to nuclear count effect. The nuclear count effect relates to signals directly produced from rays in a photosensitive device, other than from radiating light or the Cherenkov light within a sensitive volume of the detector. Such signals are produced in a manner substantially similar to that of a 30 semiconductor detector for radiation detections. For example, x-rays or secondary electrons generated therefrom may directly produce electron-hole pairs 6 FP140115-English translation of the specification in the sensitive area of a photoelectric diode, other than producing from radiating light or the Cherenkov light. Comparing to Cherenkov effect, Such an event has a very low possibility to happen, but will have significant influence once it occurs. The reason is that generation of one electron-hole pair in a silicon semiconductor 5 requires energy accumulation of only 3.6eV, and the resulting signal will be superimposed, as disturbing signal, on a signal generated from the Cherenkov light. According to another embodiment of the present invention, a Cherenkov detector as shown in Fig. 4 is provided to reduce the nuclear count effect. As 10 shown in Fig. 4, the Cherenkov detector is a detector in a rectangular shape, and includes a radiator 42, a reflective sheet 43 and a light-proof layer 44. X-rays pass through a collimator 3, and then enter the detector along a direction of the length of the detector. A photodetector 41, such as a photodiode , is arranged far away from where the rays enter. The surface of the photoelectric detection 15 element 41 that receives the Cherenkov light is approximately parallel to the incident direction of the X-rays. According to a further embodiment of the present invention, the Cherenkov detector is in the shape of a rectangular plate having a length of about 250mm, a width of about 50mm, and a height of about 10mm. The direction of the length is the incident direction of the X-ray. Such configuration of 20 the detector can considerably suppress the nuclear count effect. According to a further embodiment of the present invention, the radiator has a cuboid shape, and receives the incident X-ray beams at one of its end surfaces. A photodetector is provided on at least one end surface perpendicular to the end surface receiving the incident X-ray beams. The photodetector receives the Cherenkov light. 25 According to a still further embodiment of the present invention, the side surface of the photodetector that receives the Cherenkov light may surround the radiator. This improves efficiency for light collection. According to a further embodiment of the present invention, the radiator includes a first part, and a second part that is coupled and perpendicular to the first 30 part. The photodetector is disposed at an end of the first part. The x-ray beams enters the second part in a direction approximately parallel to the second part. 7 FP140115-English translation of the specification According to a further embodiment of the present invention, the radiator 42 is in a shape of a column. The x-ray beams are received at an end surface of the column. The ephotodetector 41 is disposed at a side surface of the column for receiving the Cherenkov light. Preferably, the side surface of the photodetector 41 5 that receives the Cherenkov light may surround the radiator. This improves efficiency for light collection. Fig. 5 is a schematic diagram of a Cherenkov detector according to a further embodiment of the present invention. As shown in Fig. 5, the Cherenkov detector has an "L" shape. A photodetector 51 is provided at an end of one branch of an 10 "L" shaped radiator 52. X-ray beams enter the radiator in a direction approximately parallel to the other brand of the "L" shaped radiator 52. As shown in Fig. 5, the X-ray beams enter the "L" shaped radiator 52 from one of its end surfaces. The photodetector is provided at the other end surface of the "L" shaped radiator. The surface of the photodetector that receives the X-ray 15 beams is approximately parallel to the incident direction of the X-ray beams. Fig. 6 is a schematic diagram showing another application of the Cherenkov detector shown in Fig. 5. As shown in Fig. 6, X-ray beams irradiate along a direction opposite to one of the end surfaces of the "L" shaped radiator. The photodetector is provided at the other end surface of the "L" shaped radiator. The 20 surface of the photodetector that receives the X-ray beams is approximately parallel to the incident direction of the X-ray beams. Fig. 7 is a schematic diagram of a Cherenkov detector according to a still further embodiment of the present invention. As shown in Fig. 7, the radiator 72 is in a "U" shape, and first and second photodetectors 711 and 712 are provided at 25 both ends of the "U" shaped radiator 72, respectively. X-ray beams enter the bottom of the "U" shaped radiator in a direction approximately perpendicular to the two branches of the "U" shaped radiator. This embodiment is useful for efficient collection of light. The Cherenkov detectors in the above embodiments can suppress the nuclear count effect. No matter where the X-rays incident into the 8 FP140115-English translation of the specification sensitive volume of the detector may work, collection of the generated Cherenkov light will remain substantially the same. To further suppress influence of scattering on the photodetector, the Cherenkov radiator maybe surrounded by a metal layer. The Al layer may absorb 5 X-rays beyond the width of the radiator, and X-rays scattered by the radiator, thereby reducing the intense of a scattering field around the photodetector. Since the atomic number of Al is similar to and less than that of silicon constituting the material of the photoelectric diode, x-rays sensitive to the material, silicon, can be shielded out by surrounding the photoelectric diode with the Al sheet. According 10 to an embodiment of the present invention, a detector of energy-deposit type may be provided in parallel to the Cherenkov detector and configured for conventional x-ray detection. As will be appreciated by those skilled in the art, the above-described solutions encompass various technologies such as X-ray inspection systems of direct 15 penerating detection type, CT detection, and dual-energy CT detection. The present invention has been described with reference to several exemplary embodiments. It will be appreciated that the terms used here are for illustration, are exemplary other than limiting. The present invention can be practiced in various forms within the spirit or subject matter of the present invention. It will be 20 appreciated that the foregoing embodiments are not limited to any of the above detailed description, and should be construed in a broad sense within the spirit and scope defined by the appended claims. All changes and variations falling into the scope of the claims or their equivalents should be encompassed by the appended claims. 25 9
    权利要求:
    Claims (13)
    [1] 1. An apparatus for measuring an effective atomic number of an object, comprising: a ray source configured to product a first X-ray beam having a first energy and 5 a second X-ray beam having a second energy; a Cherenkov detector configured to receive the first X-ray beam and the second X-ray beam that pass through an object under detection, and to generate a first detection value and a second detection value; and a data processing device configured to obtain an effective atomic number of 10 the object based on the first detection value and the second detection value.
    [2] 2. The apparatus of claim 1, wherein the ray source comprises an electron accelerator and a target, wherein the electron accelerator is configured to produce electron beams of different energy levels to bombard the target and generate the first and second x-ray beams. 15
    [3] 3. The apparatus of claim 1, wherein the Cherenkov detector comprises a radiator configured to receive incident X-ray beams and generate Cherenkov light, a photodetector configured to detect the Cherenkov light and generate electric signals, and an auxiliary circuit configured to generate the first and second detection values based on the electric signals. 20
    [4] 4. The apparatus of claim 3, wherein the photodetector comprises a photoelectric diode.
    [5] 5. The apparatus of claim 3, wherein a surface of the photodetector that receives the Cherenkov light is approximately parallel to an incident direction of the X-ray beams. 25
    [6] 6. The apparatus of claim 3, wherein the radiator comprises a first part and a second part coupled and perpendicular to the first part, wherein the photodetector is provided at an end of the first part, and the X-ray beams enter the second part in a direction approximately parallel to the second part. 10 FP140115-English translation of the specification
    [7] 7. The apparatus of claim 3, wherein the radiator has a "L" shape, the photodetector is provided at an end of one of branches of the "L" shaped radiator, and the X-ray beams enter the other branch of the "L" shaped radiator in a direction approximately parallel to the other branch. 5
    [8] 8. The apparatus of claim 3, wherein the radiator has a "U" shape, the photodetector is provided at both ends of the "U" shaped radiator, and the X-ray beams enter the bottom of the "U" shaped radiator in a direction approximately perpendicular to two branches of the "U" shaped radiator.
    [9] 9. The apparatus of claim 3, wherein the radiator has a cuboid shape, and 10 receives the X-ray beams at an end surface of the radiator, wherein the photodetector is provided on at least one surface of the radiator that is perpendicular to the end surface, and receives the Cherenkov light.
    [10] 10. The apparatus of claim 9, wherein the surface of the photodetector that receives the Cherenkov light surrounds the radiator. 15
    [11] 11. The apparatus of claim 3, wherein the radiator has a column shape, and receives the X-ray beams at an end surface of the column, wherein the photodetector is provided on a side surface of the radiator, and receives the Cherenkov light.
    [12] 12. The apparatus of claim 11, wherein the surface of the photodetector that 20 receives the Cherenkov light surrounds the radiator.
    [13] 13. A method for measuring an effective atomic number of an object, comprising: producing a first X-ray beam having a first energy and a second X-ray beam having a second energy; 25 receiving, by a Cherenkov detector, the first X-ray beam and the second X-ray beam that pass through an object under detection, and generating a first detection value and a second detection value; and 11 FP140115-English translation of the specification obtaining an effective atomic number of the object based on the first detection value and the second detection value. 12
    类似技术:
    公开号 | 公开日 | 专利标题
    US8884236B2|2014-11-11|Detector with active collimators
    EP2889610B1|2020-04-22|Dual isotope nuclear resonance fluorescence for isotope identification, assay and imaging with mono-energetic gamma-ray sources
    Esposito et al.2011|Energy sensitive Timepix silicon detector for electron imaging
    GB2409271A|2005-06-22|X-ray inspection and material discrimination
    AU2012361427B2|2015-03-05|Method and device for measuring effective atomic number of object
    US8588370B2|2013-11-19|Article inspection device and inspection method
    US7599463B2|2009-10-06|Remote sensing device to detect materials of varying atomic numbers
    Ryzhikov et al.2010|A multi-energy method of nondestructive testing by determination of the effective atomic number of different materials
    Fan et al.2020|Detection of low-energy charged-particle using the ΔE-E telescope at the Back-n white neutron source
    US20150285941A1|2015-10-08|Identification of materials
    Langeveld et al.2013|A whole-system approach to x-ray spectroscopy in cargo inspection systems
    JP6108394B2|2017-04-05|Radiation energy distribution detection method and detection apparatus therefor
    JP2020091241A|2020-06-11|Neutron detection apparatus and neutron detection method
    CN202393720U|2012-08-22|Equipment for measuring effective atomic number of object
    JP2011112623A|2011-06-09|Two-stage x-ray detector
    Nillius et al.2011|Vector polarimetry at MaMi–Measurements of tensor correlation coefficients in e− bremsstrahlungs processes
    JP2019219264A|2019-12-26|Radiation measurement device
    Nesenevich et al.2012|A comparative analysis of the sensitivity of CsI |, ZnO |, and YAG | scintillators to the plasma background radiation under operating conditions of the ITER tokamak reactor
    JP2013130418A|2013-07-04|Nuclear material detection device and nuclear material detection method
    KR20190058193A|2019-05-29|Muon detector and muon detecting system having the same
    JP2011099695A|2011-05-19|Device and method of detecting high-energy x-rays
    JP5403423B2|2014-01-29|High energy X-ray energy discrimination inspection device and inspection method
    Shinomiya et al.2009|High speed signal processing for photon counting X-ray detection
    JP2014006107A|2014-01-16|Radiation detector and radiation detection method
    Walker et al.2012|Active Neutron Interrogation of Non-Radiological Materials with the Nuclear Materials Identification System
    同族专利:
    公开号 | 公开日
    GB201413128D0|2014-09-10|
    CA2861694A1|2013-07-04|
    CA2861694C|2018-02-06|
    HK1185941A1|2014-02-28|
    AU2012361427B2|2015-03-05|
    DE112012005517T5|2014-10-02|
    CN103185734B|2015-11-25|
    JP2014523528A|2014-09-11|
    US9464997B2|2016-10-11|
    CN103185734A|2013-07-03|
    US20140314201A1|2014-10-23|
    GB2512788B|2019-03-06|
    WO2013097768A1|2013-07-04|
    JP5890899B2|2016-03-22|
    GB2512788A|2014-10-08|
    引用文献:
    公开号 | 申请日 | 公开日 | 申请人 | 专利标题
    US4851687A|1987-01-13|1989-07-25|Scientific Innovations, Inc.|Detection of nitrogen in explosives|
    US5153438A|1990-10-01|1992-10-06|General Electric Company|Method of forming an x-ray imaging array and the array|
    US5087818A|1991-05-06|1992-02-11|Bicron Corporation|Beta scintillation probe|
    JPH06294871A|1993-04-09|1994-10-21|Toshiba Corp|Radiation intensity distribution measuring instrument|
    US5559324A|1995-03-23|1996-09-24|In/Us Systems, Inc.|Continuous sample detector with standard|
    US7045787B1|1995-10-23|2006-05-16|Science Applications International Corporation|Density detection using real time discrete photon counting for fast moving targets|
    US6507025B1|1995-10-23|2003-01-14|Science Applications International Corporation|Density detection using real time discrete photon counting for fast moving targets|
    JPH10221457A|1997-02-04|1998-08-21|Ishikawajima Harima Heavy Ind Co Ltd|Cherenkov defector|
    EP1004039B1|1997-08-11|2003-09-24|Bio-Scan S.A.|Method and system for radiographic imaging using gamma rays and x-ray beams|
    US6713765B2|2002-03-11|2004-03-30|Galileo Scientific, Inc.|Scintillating fiber radiation detector for medical therapy|
    AU2003272729A1|2002-09-26|2004-04-19|Massachusetts Institute Of Technology|Photonic crystals: a medium exhibiting anomalous cherenkov radiation|
    US7039159B2|2004-01-30|2006-05-02|Science Applications International Corporation|Method and system for automatically scanning and imaging the contents of a moving target|
    US7453987B1|2004-03-04|2008-11-18|Science Applications International Corporation|Method and system for high energy, low radiation power X-ray imaging of the contents of a target|
    US7166844B1|2004-06-01|2007-01-23|Science Applications International Corporation|Target density imaging using discrete photon counting to produce high-resolution radiographic images|
    US7897925B2|2007-01-04|2011-03-01|Celight, Inc.|System and method for high Z material detection|
    JP4875892B2|2005-12-28|2012-02-15|大栄無線電機株式会社|Positron lifetime measuring apparatus and measuring method|
    CA2572713C|2006-01-18|2014-09-30|Sunnybrook And Women's College And Health Sciences Centre|Cerenkov x-ray detector for portal imaging|
    CN101074935B|2006-05-19|2011-03-23|清华大学|Detector array and its apparatus|
    US7683335B2|2007-03-15|2010-03-23|Florida Agricultural And Mechanical University|Threshold Cerenkov detector with radial segmentation|
    CN101598799B|2008-06-05|2012-07-11|清华大学|Cherenkov detector and detection method by using same|
    CN101629917B|2008-07-16|2011-09-14|清华大学|Method and device for measuring effective atomic number of substance|
    US20100265078A1|2009-04-20|2010-10-21|Integrated Sensors, Llc|Plasma panel based ionizing-particle radiation detector|
    EP2510386A2|2009-12-07|2012-10-17|American Science & Engineering, Inc.|Scintillation-cherenkov detector and method for high energy x-ray cargo container imaging and industrial radiography|
    GB201004923D0|2010-03-24|2010-05-12|Sensl Technologies Ltd|Compact method for medical detection|
    WO2012054381A1|2010-10-18|2012-04-26|American Science And Engineering, Inc.|System and methods for intrapulse multi-energy and adaptive multi-energy x-ray cargo inspection|
    US9541510B2|2011-11-29|2017-01-10|American Science And Engineering, Inc.|System and methods for multi-beam inspection of cargo in relative motion|
    CN202393720U|2011-12-30|2012-08-22|同方威视技术股份有限公司|Equipment for measuring effective atomic number of object|CN106353828B|2015-07-22|2018-09-21|清华大学|The method and apparatus that checked property body weight is estimated in safe examination system|
    CN105181723B|2015-09-28|2019-02-12|同方威视技术股份有限公司|Dual intensity ray scanning system, scan method and inspection system|
    法律状态:
    2015-07-02| FGA| Letters patent sealed or granted (standard patent)|
    2021-07-22| MK14| Patent ceased section 143(a) (annual fees not paid) or expired|
    优先权:
    申请号 | 申请日 | 专利标题
    CN201110457151.6||2011-12-30||
    CN201110457151.6A|CN103185734B|2011-12-30|2011-12-30|Measure the method and apparatus of the effective atomic number of object|
    PCT/CN2012/087849|WO2013097768A1|2011-12-30|2012-12-28|Method and device for measuring effective atomic number of object|
    [返回顶部]